The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Sep. 19, 2016
Applicant:
Frontics, Inc, Seoul, KR;
Inventors:
Jun Yeong Kim, Seoul, KR;
Dong Il Kwon, Seoul, KR;
Kwang Ho Kim, Seongman-si, KR;
Seung Won Jeon, Seoul, KR;
Woo Joo Kim, Seoul, KR;
Seung Hun Choi, Seoul, KR;
Assignee:
FRONTICS, INC., , KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01N 3/42 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/42 (2013.01); G01N 3/08 (2013.01);
Abstract
The present invention relates to a method for measuring a fracture toughness using an instrumented indentation testing, which measures a load and an indentation depth in real time while applying a load to a specimen by an indenter having a flat punch shape.