The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Mar. 14, 2013
Applicant:

Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Shenzhen, CN;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Hua-Wei Yang, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 5/00 (2006.01); G01B 21/04 (2006.01); G01B 11/03 (2006.01); B23Q 11/00 (2006.01); G01B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 5/0014 (2013.01); B23Q 11/0003 (2013.01); G01B 11/03 (2013.01); G01B 21/045 (2013.01); G05B 2219/37193 (2013.01);
Abstract

A computing device connects with a measurement machine. The measurement machine includes a raster ruler and a measurement unit. The computing device reads environmental temperatures from a temperature sensor. Compensation coefficients of the standard workpiece and compensation coefficients of the raster ruler are calculated. The computing device calculates total compensation coefficients of the standard workpiece and the raster ruler. When the measurement machine measures an object workpiece, the computing device calculates a total error of the object workpiece according to the total compensation coefficients of the standard workpiece and the total compensation coefficients of the raster ruler. Coordinates of the object workpiece are calculated according to the total error and mechanism coordinates of each axis of the measurement machine.


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