The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Apr. 23, 2014
Applicant:

Samsung Medison Co., Ltd., Hongcheon-gun, Gangwon-Do, KR;

Inventors:

Gil-ju Jin, Gangwon-do, KR;

Mi-ri Kim, Gangwon-do, KR;

Saidmurod Akramov, Gangwon-do, KR;

Mi-jeoung Ahn, Gangwon-do, KR;

Dong-gyu Hyun, Gangwon-do, KR;

Assignee:

Samsung Medison Co., Ltd., Hongcheon-Gun, Gangwon-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/4444 (2013.01); A61B 8/429 (2013.01); A61B 8/485 (2013.01); A61B 8/5223 (2013.01);
Abstract

Provided are an ultrasound system and a method of detecting a pressure applied to an object through an ultrasound probe. The ultrasound system includes: an ultrasound data acquiring unit configured to acquire, by using an ultrasound probe including a strain gauge that is strained by a pressure applied thereto and has a damping factor and an elasticity factor, ultrasound data corresponding to an object; and a processor configured to generate an ultrasound image by using the ultrasound data, calculate a strain rate of the strain gauge caused by the pressure by using the ultrasound image, and detect the pressure by using the strain rate calculated.


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