The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
May. 09, 2013
The Schepens Eye Research Institute, Inc., Boston, MA (US);
The Ohio State University, Columbus, OH (US);
Peter Bex, Concord, MA (US);
Michael Dorr, Cambridge, MA (US);
Luis Lesmes, Watertown, MA (US);
Zhong-Lin Lu, Columbus, OH (US);
The Schepens Eye Research Institute, Inc., Boston, MA (US);
The Ohio State University, Columbus, OH (US);
Abstract
Data is received characterizing a result of a first visual sensitivity test assessing capacity to detect spatial form across one or more different target sizes, and different contrasts. Using the received data, one or more first parameters defining a first estimated visual sensitivity for a first range of contrasts and a second range of spatial frequencies is determined. One or more second parameters defining a second estimated visual sensitivity for a third range of contrasts and a fourth range of spatial frequencies is determined using the one or more first parameters and a statistical inference by at least presenting a first visual stimulus, receiving a response, and determining a second visual stimulus based at least on the response and at least a rule. The one or more second parameters is provided. Related apparatus, systems, techniques and articles are also described.