The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Jun. 05, 2015
Applicant:

Azimuth Systems, Inc., Acton, MA (US);

Inventor:

Thorkild Hansen, Hopkinton, MA (US);

Assignee:

AZIMUTH SYSTEMS, INC., Acton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/08 (2009.01); G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); G01R 29/0871 (2013.01); G01R 29/105 (2013.01); G01R 29/0892 (2013.01);
Abstract

Small anechoic chambers for evaluating a wireless device under test (DUT) are characterized by a set of antennas to which a test signal is applied and for which excitation coefficients are applied such that the test signal approximates a single plane wave or a preselected superposition of plane waves in the near field of the antennas. The test-equipment antennas in the chamber may be as close as one wavelength from the boundary of a test zone in which the DUT is disposed. Hence, the test zone can be in the near field of the test-equipment antennas and the test zone can be less than a wavelength from the chamber walls. Consequently, it is possible to perform tests in a small anechoic chamber that previously required a large anechoic chamber, e.g., advanced spatial channel-model tests and antenna-pattern measurements.


Find Patent Forward Citations

Loading…