The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jan. 27, 2014
Applicant:
Acer Incorporated, New Taipei, TW;
Inventor:
Hung-Yu Wei, New Taipei, TW;
Assignee:
ACER INCORPORATED, New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 24/10 (2009.01); H04L 5/22 (2006.01); H04W 24/02 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 5/22 (2013.01); H04W 24/10 (2013.01); H04W 24/02 (2013.01);
Abstract
A method of handling an interference measurement for a communication device in a time-division duplexing (TDD) system comprises receiving a signal; measuring an interference coming from at least one cell with at least one uplink/downlink (UL/DL) configuration in the TDD system in a subframe according to the signal, to obtain a measured interference; and generating a measurement result comprising the measured interference and information of the at least one UL/DL configuration of the at least one cell.