The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Apr. 15, 2013
Applicant:

Tekelec, Inc., Morrisville, NC (US);

Inventors:

Adam Boyd Roach, Dallas, TX (US);

Ben Allen Campbell, Irving, TX (US);

Sam Eric McMurry, Richardson, TX (US);

Assignee:

Tekelec, Inc., Morrisville, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); H04L 43/0882 (2013.01); H04L 63/08 (2013.01);
Abstract

According to one aspect, the subject matter described herein includes a system for performing Diameter overload control. The system occurs at a Diameter routing node. The system includes a network interface for receiving a Diameter message. The system also includes a Diameter overload control unit configured to detect an overload condition for a Diameter session associated with the Diameter message and to communicate an indication of the overload condition to a second Diameter node using a Diameter message defined for a purpose other than overload control.


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