The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Dec. 14, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Yasuo Hidaka, Cupertino, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03006 (2013.01); H04L 43/0823 (2013.01); H04L 25/03038 (2013.01); H04L 25/03057 (2013.01); H04L 2025/0349 (2013.01);
Abstract

A method of selecting filter patterns is provided. The method may include measuring an average sign value of aggregate inter-symbol interference (ISI) for a data sequence using multiple filter pattern combinations of multiple filter patterns; estimating a first analog level of aggregate ISI for a first filter pattern based on a first average sign value, and a second analog level of aggregate ISI for a second filter pattern based on a second average sign value; estimating an analog level of individual ISI of the first filter pattern pair based on the first analog level and the second analog level; estimating, for each possible filter pattern combination, an analog level of aggregate ISI for the first filter pattern pair; and selecting a filter pattern combination for the first filter pattern pair that reduces the analog level of aggregate ISI.


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