The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

May. 27, 2016
Applicant:

Vencore Labs, Inc., Basking Ridge, NJ (US);

Inventors:

James Dailey, Basking, NJ (US);

Anjali Agarwal, Basking Ridge, NJ (US);

Paul Toliver, Basking Ridge, NJ (US);

Colin McKinstrie, Basking Ridge, NJ (US);

Nicholas Peters, Knoxville, TN (US);

Assignee:

Vencore Labs, Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04B 10/90 (2013.01);
U.S. Cl.
CPC ...
H04B 10/90 (2013.01);
Abstract

A system and method for processing an input signal includes a non-linear material component for receiving the signal. The non-linear material component is selected to mix the input signal with an optical pump wave to output an optical signal. The system also includes a parametric amplifier coupled to the non-linear material to obtain the optical signal and to amplify the optical signal to generate an amplified signal and an amplified idler which is a conjugate image of the amplified signal. The system also includes a frequency converter, to obtain the amplified signal and the amplified idler from the parametric amplifier and to convert the amplified signal and the amplified idler into a first output and a second output. The system also includes a first spectral sampling and processing apparatus to obtain and process the first output.


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