The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jun. 18, 2015
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventor:
Jae-Bum Kim, Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/15 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01); H03M 13/11 (2006.01); G11C 16/26 (2006.01); G11C 11/56 (2006.01); G11C 29/04 (2006.01); H03M 13/23 (2006.01); H03M 13/25 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1575 (2013.01); G06F 11/1012 (2013.01); H03M 13/6325 (2013.01); G11C 11/5642 (2013.01); G11C 16/26 (2013.01); G11C 29/52 (2013.01); G11C 2029/0411 (2013.01); H03M 13/1102 (2013.01); H03M 13/152 (2013.01); H03M 13/1515 (2013.01); H03M 13/23 (2013.01); H03M 13/251 (2013.01); H03M 13/256 (2013.01); H03M 13/2957 (2013.01);
Abstract
An operating method of a controller that includes: when a first ECC decoding on data read from a semiconductor memory device according to a hard read voltage fails, generating one or more quantization intervals based on the number of unsatisfied syndrome check (USC), which is a result of the first ECC decoding; and performing a second ECC decoding on the data by generating soft read data according to soft read voltages determined by the hard read voltage and the quantization intervals.