The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Jan. 14, 2015
Applicant:

Blackberry Limited, Waterloo, CA;

Inventors:

John Hanford Spears, Johnsburg, IL (US);

Wayne Eric Smith, Crystal Lake, IL (US);

Chenggang Sui, Ellicott City, MD (US);

Yongfei Zhu, Nashua, NH (US);

Assignee:

BlackBerry Limited, Waterloo, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03H 7/40 (2006.01); H03H 11/30 (2006.01); H04B 1/04 (2006.01); H01Q 1/50 (2006.01);
U.S. Cl.
CPC ...
H03H 11/30 (2013.01); H01Q 1/50 (2013.01); H03H 7/40 (2013.01); H04B 1/0458 (2013.01);
Abstract

Methods for generating a look-up table relating a plurality of complex reflection coefficients to a plurality of matched states for a tunable matching network. Typical steps include measuring a plurality of complex reflection coefficients resulting from a plurality of impedance loads while the tunable matching network is in a predetermined state, determining a plurality of matched states for the plurality of impedance loads, with a matched state determined for each of the plurality of impedance loads and providing the determined matched states as a look-up table. A further step is interpolating the measured complex reflection coefficients and the determined matching states into a set of complex reflection coefficients with predetermined step sizes.


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