The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Apr. 18, 2016
Applicant:

Thermo Fisher Scientific (Bremen) Gmbh, Bremen, DE;

Inventors:

Jan-Peter Hauschild, Bremen, DE;

Oliver Lange, Bremen, DE;

Ulf Fröhlich, Bremen, DE;

Andreas Wieghaus, Bremen, DE;

Alexander Kholomeev, Bremen, DE;

Alexander Makarov, Bremen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/38 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4265 (2013.01); H01J 49/0031 (2013.01); H01J 49/04 (2013.01); H01J 49/38 (2013.01); H01J 49/425 (2013.01); H01J 49/4245 (2013.01);
Abstract

A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.


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