The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jun. 20, 2016
Applicant:
I2o3d Holdings Limited, Hertfordshire, GB;
Inventor:
Adam Michael Baumberg, Guildford, GB;
Assignee:
i2o3d Holdings Limited, Hertfordshire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 19/00 (2011.01); H04N 5/232 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0042 (2013.01); G06T 7/73 (2017.01); G06T 7/74 (2017.01); G06T 19/006 (2013.01); H04N 5/232 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract
A method is provided for estimating parameters of an imaging device with respect to an image of a scene said method comprising the steps of locating a target coordinate system in a scene, using an imaging device to capture an image of the scene, and processing the image using the target coordination system as a reference to estimate the parameters of the imaging device with respect to the image, wherein the target coordinate system comprises at least one planer target and wherein the at least one planar target contains a set of identifiable features with known relative positions.