The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jun. 12, 2014
Altek Semiconductor Corp., Hsinchu, TW;
Yu-Chih Wang, Tainan, TW;
Hong-Long Chou, Hsinchu, TW;
Che-Lun Chuang, Hsinchu, TW;
Yao-Sheng Wang, Tainan, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
An image capturing device and a method for detecting image deformation thereof are provided. The method is for the image capturing device having a first sensor and a second image sensor, and the method includes the following steps. A first image is captured through the first image sensor, and a second image is captured through the second image sensor. A deform detection is performed according to the first and second images so as to obtain a comparison information between the first and second images. Whether a coordinate parameter relationship between the first and second images being varied is determined according to the comparison information, in which the coordinate parameter relationship is associated with a spatial configuration relationship between the first and second image sensors.