The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Oct. 02, 2014
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Adrien Gaidon, Grenoble, FR;

Diane Larlus-Larrondo, La Tronche, FR;

Florent C. Perronnin, Domène, FR;

Assignee:

XEROX CORPORATION, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6212 (2013.01); G06K 9/4642 (2013.01); G06K 9/6256 (2013.01);
Abstract

An object detection method includes for each of a set of patches of an image, encoding features of the patch with a non-linear mapping function, and computing per-patch statistics based on the encoded features for approximating a window-level non-linear operation by a patch-level operation. Then, windows are extracted from the image, each window comprising a sub-set of the set of patches. Each of the windows is scored based on the computed patch statistics of the respective sub-set of patches. Objects, if any, can then be detected in the image, based on the window scores. The method and system allow the non-linear operations to be performed only at the patch level, reducing the computation time of the method, since there are generally many more windows than patches, while not impacting performance unduly, as compared to a system which performs non-linear operations at the window level.


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