The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

May. 18, 2015
Applicant:

Facebook, Inc., Menlo Park, CA (US);

Inventor:

Giridhar Rajaram, Cupertino, CA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06K 9/80 (2006.01); G06T 7/11 (2017.01); G06T 7/162 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6202 (2013.01); G06K 9/4647 (2013.01); G06K 9/6215 (2013.01); G06K 9/6267 (2013.01); G06K 9/80 (2013.01); G06T 7/11 (2017.01); G06T 7/162 (2017.01);
Abstract

Identifying whether an image includes a search image can be accomplished using region analysis and/or parts model analysis. Region analysis can include dividing a received image into regions and analyzing each region by: enlarging the region, applying a gradient histogram transformation to the enlarged region, and comparing the transformed region, at various angles, to a set of search patterns. Parts model analysis can include identifying key features of an image such as prominent lines or areas, objects or object edges, consecutive colors; generating one or more parts models from the key features by representing the key features as geometric objects; and comparing each parts model, at various angles, to a set of search patterns. The comparison employed in region analysis or parts model analysis can employ classifiers trained on the search images.


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