The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Apr. 12, 2013
Applicant:

The Hong Kong Polytechnic University, Kowloon, Hong Kong, CN;

Inventors:

Weinong Fu, Hong Kong, CN;

Xiu Zhang, Hong Kong, CN;

Siu-Iau Ho, Hong Kong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H03H 17/02 (2006.01); H01P 1/213 (2006.01); G06F 17/12 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5018 (2013.01); H03H 17/02 (2013.01); G06F 17/12 (2013.01); G06F 2217/16 (2013.01); H01P 1/2138 (2013.01);
Abstract

A method for generating an EMF model includes establishing a time-domain finite data model associated with an electric device representing the electric device in the time-domain; utilizing the time domain finite data model, determining excitations representing an electrical characteristic of an electrical components of the electric device; and generating an EMF model by processing the excitations with a transformation routine determining an approximate representation of an EMF generated by the electric device. A system for generating the EMF model includes a modelling module establish a time-domain finite data model associated with the electric device and d representing the electric device in the time-domain. The modelling module utilizes the time domain finite data model to determine excitations representing an electrical characteristic of an electrical component of the electric device. The system includes a processing module generating an EMF model by processing the excitations with a transformation routine.


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