The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
May. 11, 2015
Parasoft Corporation, Monrovia, CA (US);
Marek Kucharski, Crakow, PL;
Elizabeth Kolawa, Bradbury, CA (US);
Piotr Pepek, Crakow, PL;
Patrycjusz Franczak, Crakow, PL;
Jakub Labenski, Crakow, PL;
Miroslaw Zielinski, Crakow, PL;
Parasoft Corporation, Monrovia, CA (US);
Abstract
Method for generating dynamically configurable test doubles for software testing includes: detecting functions or methods invocations in a source code under test; collecting information about parameters and return types of one or more of original functions and original methods that are invoked by the source code under test, generating test doubles using source code with alternative definitions based on collected information; instrumenting the source code under test to replace the calls to one or more of original functions and methods with calls to the generated test doubles; and dynamically configuring runtime behavior of the generated test doubles, where all input parameters and return values of the one or more of original functions and original methods are provided to respective retrieved trigger objects by passing said input parameters and return values as arguments to function calls.