The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Jul. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Joseph C. Leong, West Lafayette, IN (US);

Lauren J. Hayward Schaefer, Newark, DE (US);

David G. Terry, Nashua, NH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3668 (2013.01); G06F 8/71 (2013.01);
Abstract

A method for verifying historical artifacts in disparate source control systems. The method comprises obtaining historical artifacts from a target repository; obtaining historical artifacts from a source repository; and verifying the historical artifacts in the target repository match the historical artifacts in the source repository. Verification further comprises comparing commit data in the historical artifacts in the target repository with commit data in the historical artifacts in the source repository; and evaluating whether each commit data event in the historical artifacts in the target repository is equivalent to the corresponding commit data event in the historical artifacts in the source repository. Evaluating further comprises logging a commit data event in the historical artifacts in the target repository which is not equivalent to a corresponding commit data event in the historical artifacts in the source repository; and reviewing the logging results.


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