The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Jul. 30, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Chen Wang, Beijing, CN;

Lanjun Wang, Beijing, CN;

Hai Shan Wu, Beijing, CN;

Yi Yang, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 11/32 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01); G06F 11/323 (2013.01); G06F 11/3466 (2013.01);
Abstract

A system for determining a root cause of a performance issue of a software application executing in a distributed computer system. The system includes constructing a hierarchical graph of metrics of a component of the distributed computer system based on search traces of the metrics of different users. A parent-child edge between a first metric and a second metric in the hierarchical graph is constructed when there is a sequential association between the search traces. A sibling edge between the first metric and the second metric in the hierarchical graph is constructed when there is no sequential association between the search traces. A metric investigation recommendation is provided to address the performance issue based on traversal of the hierarchical graph of the metrics.


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