The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Mar. 10, 2014
Applicant:

Accenture Global Services Limited, Dublin, IE;

Inventors:

Colin Puri, San Jose, CA (US);

Scott Kurth, San Francisco, CA (US);

Srinivas Yelisetty, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/34 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3476 (2013.01); G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/3072 (2013.01); G06F 11/3089 (2013.01); G06F 11/3452 (2013.01); G06F 17/30011 (2013.01); G06F 2201/86 (2013.01);
Abstract

Event correlation may include identifying a feature set for each log file of a plurality of log files, and extracting the feature set for each event of a plurality of events in each log file of the plurality of log files. Event correlation may further include determining a plurality of trace event pairs linkage strength values for an event from a first log file of the plurality of log files and a plurality of events from a second log file of the plurality of log files. The trace event pairs linkage strength values may represent an overlap of the feature set for the event from the first log file and the feature set for each of the plurality of events from the second log file.


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