The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Oct. 19, 2012
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventor:
Maurice Garcia, San Francisco, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06F 3/0487 (2013.01); G01B 11/02 (2006.01); G06F 3/0482 (2013.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06F 3/0487 (2013.01); G01B 11/02 (2013.01); G01B 11/022 (2013.01); G06F 3/0482 (2013.01); G06T 7/62 (2017.01); G06T 2207/10004 (2013.01);
Abstract
Provided are methods, systems, devices, and computer programs enabling the measurement of various objects using imaging. The inventions are adaptable to mobile devices such as smartphones, allowing a range of unique measurements to be conveniently made, including length, area, distance, velocity, and height. The methods, systems, devices, and computer programs include the novel application of image-based measurement in medical, research, and other contexts.