The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Dec. 11, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Junqing Sun, Fremont, CA (US);

Danjin Wu, Sunnyvale, CA (US);

Hung Nguyen, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 27/28 (2006.01); G01N 22/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/021 (2013.01); G01N 22/00 (2013.01); G01R 27/28 (2013.01);
Abstract

Systems, methods, and other embodiments associated with testing a cable are described. According to one embodiment, an integrated circuit device includes a transmitter, a receiver, cable tester logic and a cable test control logic. The transmitter is configured to transmit signals to a cable. The receiver is configured to receive signals from the cable. The cable tester logic includes an echo tester configured to identify peaks corresponding to echo canceller coefficients that model an impulse response of reflected signals received by the receiver and a power-based cable tester configured to determine a power-based cable length based on an attenuation of a signal received from the link partner. The cable test control logic is configured to selectively activate one or both of the echo tester and the power-based tester and to determine a cable length based, at least in part, on the power-based cable length and the identified peaks.


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