The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jun. 28, 2013
Landis+gyr, Inc., Lafayette, IN (US);
John T. Voisine, Lafayette, IN (US);
Landis+Gyr, Inc., Lafayette, IN (US);
Abstract
A method measures a resistance of an element that is operably coupled to receive an AC line voltage. The method includes obtaining a first voltage measurement value V1A from a first side of the element at a first time, and obtaining a second voltage measurement value V2A from a second side of the element at the first time. The method also includes obtaining a first current measurement value IA through the element at the first time, and obtaining a second current measurement value IB through the element at the second time. The method further includes obtaining a third voltage measurement value V1B from the first side of the element at a second time, and obtaining a fourth voltage measurement value V2B from the second side of the element at the second time. The processing device determines the resistance at least in part based on the values V1A, V2A, V1B, V2B, IA and IB. The determination based on an adjusted difference of V2B and V2A.