The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Aug. 22, 2012
Toshiyasu Suyama, Hamamatsu, JP;
Toshiyasu Suyama, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A nondestructive inspection devicecomprises an X-ray indicator, a low-energy detector, a high-energy detector, a low-energy transmittance calculation unit, a high-energy transmittance calculation unit, a detection unit, and a correction unit. The calculation unitcalculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unitcalculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unitdetects a positional deviation detail of the X-ray indicatoraccording to a ratio between the transmittances calculated by both of the calculation units. When the positional deviation detail of the X-ray indicatoris detected by the detection unit, according to the positional deviation detail, the correction unitcorrects X-ray luminance data detected by the detectors