The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Apr. 08, 2016
Applicant:
Taiwan Biophotonic Corporation, Zhubei, TW;
Inventors:
Yu-Tang Li, Zhubei, TW;
Chang-Sheng Chu, Zhubei, TW;
Pei-Cheng Ho, Zhubei, TW;
Kuan-Jui Ho, Zhubei, TW;
Shuang-Chao Chung, Zhubei, TW;
Chih-Hsun Fan, Zhubei, TW;
Jyh-Chern Chen, Zhubei, TW;
Assignee:
Taiwan Biophotonic Corporation, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01N 21/21 (2006.01); A61B 5/1455 (2006.01); G01B 11/27 (2006.01); G01N 33/483 (2006.01); A61B 3/10 (2006.01); A61B 3/15 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); A61B 3/10 (2013.01); A61B 3/152 (2013.01); A61B 5/1455 (2013.01); G01B 11/272 (2013.01); G01N 33/483 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0683 (2013.01); G01N 2201/126 (2013.01);
Abstract
The present disclosure generally relates to a device and a method for alignment. The alignment device provides optical architecture to align the alignment device to an analyte and measure the optical properties of an analyte. The method for alignment provides steps for aligning an optical measurement device to an analyte.