The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Feb. 21, 2012
Takashi Yasuda, Hamamatsu, JP;
Kouichiro Akiyama, Hamamatsu, JP;
Yoichi Kawada, Hamamatsu, JP;
Atsushi Nakanishi, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
Takashi Yasuda, Hamamatsu, JP;
Kouichiro Akiyama, Hamamatsu, JP;
Yoichi Kawada, Hamamatsu, JP;
Atsushi Nakanishi, Hamamatsu, JP;
Hironori Takahashi, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
In a terahertz-wave spectrometer, a spectroscopic prism is provided with a prism part slidable with respect to a main part thereof. Along the sliding direction, an arrangement surface in an upper face of the prism part is provided with a plurality of arrangement regions K to be arranged with objects to be measured. Therefore, after completing the measurement of optical constants for one object, the prism part is slid, so as to shift the next object onto an optical path of a terahertz wave T, whereby a plurality of objects can be measured smoothly without cleaning the arrangement surface.