The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jul. 28, 2013
Adom, Advanced Optical Technologies Ltd., Lod, IL;
Yoel Arieli, Jerusalem, IL;
Yosef Weitzman, Tel Aviv, IL;
ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD., Lod, IL;
Abstract
A system () for measuring a physical characteristic of an object () using dual path, two-dimensional Optical Coherence Tomography (OCT) includes an extended broadband light source () producing an incident light beam () and an interferometer () having a beam splitter () that splits the incident beam into first and second component () beams and directs the second component beam () on to a moveable mirror () for creating an optical path difference between the first component beam () and a reflection () of the second component beam. A focusing lens () having a focal plane () focuses the first component beam and the reflection of the second component beam to form a fringe pattern () on the focal plane, and a configurable imaging system () images the fringe pattern on to a plane () of the object to allow two-dimensional measurement of the object without spatial scanning.