The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2017
Filed:
Jun. 29, 2011
Jason D. Harry, Rumford, RI (US);
Blair A. Barbour, Madison, AL (US);
David Scott Ackerson, Easton, MD (US);
Francois I. Luks, Barrington, RI (US);
Jason D. Harry, Rumford, RI (US);
Blair A. Barbour, Madison, AL (US);
David Scott Ackerson, Easton, MD (US);
Francois I. Luks, Barrington, RI (US);
LUCIDUX, LLC, Providence, RI (US);
PHOTON-X, INC., Kissimmee, FL (US);
Abstract
Systems and methods deform the surface of the material with a probe, such as a mechanical device or a gas/liquid jet, while optically recording in detail the three-dimensional (3D) topography of the resulting surface deformation. The probe effectively applies a forcing function to the material, the attributes of which are known by performing calibrations prior to use or by direct measurement while it is applied. The topography is effectively the system output that is measured as indicative of the underlying mechanical properties of the material. In one application, systems and methods that apply a pressure in-vivo to human tissue and analyze a three-dimensional topography of the resulting surface deformation to identify localized inhomogeneities and anomalies in the human tissue.