The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Aug. 23, 2013
Futurewei Technologies, Inc., Plano, TX (US);
Younghoon Kwon, San Diego, CA (US);
Yunsong Yang, San Diego, CA (US);
Zhigang Rong, San Diego, CA (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
System and method embodiments are provided for nearby channel measurement. The embodiments enable identifying stations that are hidden from one another. In an embodiment, a method in a wireless access point (AP) for identifying channel quality between a first and second group of STAs associated with the AP includes transmitting a first packet to the first group of STAs, wherein the first packet comprises information on measurement time window within which the first group of STAs is to measure a received signal; transmitting scheduling information to the second group of STAs, wherein the scheduling information indicates a time to send a reference packet during the measurement time window; and receiving a measurement report from the first group of STAs after the measurement time window, wherein measurement report includes information on received signal quality at the first group of STAs of a signal transmitted by the second group of STAs.