The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Jun. 16, 2014
Altek Semiconductor Corp., Hsinchu, TW;
Hong-Long Chou, Hsinchu County, TW;
Ming-Jiun Liaw, Miaoli County, TW;
Simon Mong-Lun Law, Hsinchu, TW;
Chan-Min Chou, New Taipei, TW;
Ching-Lung Tsai, Hsinchu, TW;
Yu-Chih Wang, Tainan, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
A method for calibrating image deformation of an image capturing device having a first and second lens, a focusing actuator, and a prestored first focusing step-to-focusing distance relation includes the following steps. A plurality of image sets are captured by the first and second lens, where each of the image sets includes a first and second image, and the images sets include a reference image set. It is detected whether the reference image set is deformed. When the reference image set is detected to be deformed, the first focusing step-to-focusing distance relation is calibrated according to a focusing step and a focusing distance corresponding to each of the image sets, where the focusing step corresponding to each of the image sets is the number of steps that the focusing actuator is required to move the first and second lens to a focusing position to generate each of the image sets.