The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Apr. 12, 2016
Applicant:

Hand Held Products, Inc., Fort Mill, SC (US);

Inventors:

Scott McCloskey, Minneapolis, MN (US);

Ben Miller, Minneapolis, MN (US);

Assignee:

Hand Held Products, Inc., Fort Mill, SC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 5/50 (2006.01); G06K 7/10 (2006.01); G06K 7/14 (2006.01); G06K 9/00 (2006.01); H04N 13/00 (2006.01); G06T 7/55 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/0228 (2013.01); G06K 7/10811 (2013.01); G06K 7/10831 (2013.01); G06K 7/10841 (2013.01); G06K 7/1413 (2013.01); G06K 9/00255 (2013.01); G06K 9/00288 (2013.01); G06K 9/00604 (2013.01); G06K 9/00617 (2013.01); G06T 5/50 (2013.01); G06T 7/55 (2017.01); G06T 7/593 (2017.01); H04N 13/004 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10052 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30201 (2013.01); G06T 2207/30204 (2013.01);
Abstract

An imaging device has a light field imager and a processor. The light field imager includes a microlens array, and a light field sensor positioned proximate to the microlens array, having a plurality of pixels and recording light field data of an optical target from light passing through the microlens array. The processor is configured to: receive the light field data of the optical target from the light field sensor, estimate signal to noise ratio and depth of the optical target in the light field data, select a subset of sub-aperture images based on the signal to noise ratio and depth, combine the selected subset of sub-aperture images, and perform image analysis on the combined subset of sub-aperture images.


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