The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

May. 22, 2014
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventor:

Eiji Kaneko, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/33 (2006.01); H04N 5/225 (2006.01); G06T 7/90 (2017.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
H04N 5/332 (2013.01); G06T 7/90 (2017.01); H04N 5/2256 (2013.01); G01N 21/27 (2013.01); G06T 2207/10024 (2013.01);
Abstract

Illumination estimation device includes: target object area extraction unit which extracts an object area from a multispectral image, the object area being an area, including specular reflection, of an object; distribution characteristics estimation unit which estimates information representing a subspace that approximates a distribution of observation values in a spectral space, as distribution characteristics, the distribution characteristics being characteristics of a spreading manner of the observation values in the object area within the spectral space; dimension reduction unit which selects a distribution characteristic to be used from among the distribution characteristics estimated by the distribution characteristics estimation unit depending on the number of dimensions to be reduced, the number of dimensions to be reduced being determined in advance by a light environment; and illumination estimation unit which estimates spectral characteristics of illumination based on the subspace information to be represented by the distribution characteristic selected by the dimension reduction unit.


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