The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Oct. 30, 2012
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Xiaopeng Zhang, Richmond Hill, CA;

Gang Qiu, Markham, CA;

Jilai Wang, Richmond Hill, CA;

Xiaoming Zhou, Markham, CA;

Liang Shen, Toronto, CA;

Milivoje Aleksic, San Diego, CA (US);

Sundeep Vaddadi, San Diego, CA (US);

Shaojie Zhuo, Markham, CA;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
H04N 5/332 (2013.01); G06T 7/33 (2017.01); G06T 2207/10048 (2013.01);
Abstract

Systems and methods for multispectral imaging are disclosed. The multispectral imaging system can include a near infrared (NIR) imaging sensor and a visible imaging sensor. The disclosed systems and methods can be implemented to improve alignment between the NIR and visible images. Once the NIR and visible images are aligned, various types of multispectral processing techniques can be performed on the aligned images.


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