The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Sep. 21, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takashi Kageyama, Yokosuka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/232 (2006.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2351 (2013.01); H04N 5/2354 (2013.01); H04N 5/23212 (2013.01); H04N 5/3696 (2013.01);
Abstract

An image pickup apparatus capable of obtaining focusing information at the time of photometry for emission control and of controlling an emission quantity appropriately. An image pickup device receives a pair of light beams that pass through different pupil division areas of an imaging optical system with a pair of photoelectric conversion sections. An extraction unit extracts candidates from a pre-emission image. A calculation unit finds focused areas and defocus areas in the pre-emission image. A selection unit selects a light-control target area from the candidates according to information about the focused areas. A control unit controls emission quantity so that luminance in the light-control target area becomes predetermined luminance. The calculation unit finds the information about the focused areas based on difference information between a first phase difference signal read from one photoelectric conversion section and a second phase difference signal read from the other photoelectric conversion section.


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