The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Dec. 30, 2013
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Xinyi Zhang, San Jose, CA (US);

Kevin Yu, Palo Alto, CA (US);

Matthew Lawlor, Oakland, CA (US);

Assignee:

Google Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); H04L 43/04 (2013.01);
Abstract

Described herein are systems, mediums, and methods for simultaneously determining multiple types of changes in time series data. A plurality of potential change points may be selected in a signal representing the time series data. For each potential change point the signal may be a split into two segments including data points before and data points after the potential change point, respectively. Estimate of cumulative distribution function for each segment may be determined. A normalized difference of the respective estimates of cumulative distribution functions may be determined. The normalized difference may be compared to a threshold value to determine whether the potential change point qualifies as valid change point. The techniques discussed herein may determine at least two valid change points representing at least two different types of changes in the signal.


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