The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Aug. 19, 2014
Benefitfocus.com, Inc., Charleston, SC (US);
Michael Rosier, Mt. Pleasant, SC (US);
Benefitfocus.com, Inc., Charleston, SC (US);
Abstract
A system can correlate derived metrics for system activity to determine problems and recommend solutions. Using a hierarchy of derived metrics from a set of raw metrics, a system can identify a problem, correlate related metrics and determine a recommended solution. For example, raw metrics can be collected about computing resources. Analyzers can process the raw metrics and outputs from other analyzers to gather metrics that include metrics derived from other metrics. When a problem symptom is discovered, derived metrics (and other metrics) can be correlated with the symptom to help identify the problem. Using the correlated metrics, a system can recommend a solution to an identified problem.