The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Oct. 16, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Mehul Soman, Dallas, TX (US);
Tarkesh Pande, Richardson, TX (US);
Il Han Kim, Allen, TX (US);
Anuj Batra, Mountain View, CA (US);
Minghua Fu, Plano, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A band of interest is divided into band segments. A scan frame is sent by a transmitter at a transmitting PLC node across each band segment. A receiver at a receiving node scans the band segments, listening for the scan frame. Upon detecting a scan frame, the receiving node measures the signal quality of each OFDM subcarrier modulated with symbols from the scan frame. The subcarrier signal quality values are stored in a table. Upon completion of the scan process, the table contains a signal quality value for each subcarrier within the band of interest. The table is then analyzed to find an operating band consisting of subcarriers with a highest average signal quality or a band that results in greater than a pre-determined minimum signal quality. The invented methods and embodiments may operate periodically to readjust the operating band configuration in the presence of electromagnetic interference including time-variant interference.