The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
May. 11, 2015
Jmicron Technology Corporation, Irvine, CA (US);
Mohammad Athar Khalil, Irvine, CA (US);
Shirley Xiaoling Fang, San Diego, CA (US);
Jimmy Pu, Cerritos, CA (US);
Maxio Technology (Hangzhou) Ltd., Hangzhou, CN;
Abstract
The present invention provides systems and methods to detect when hard decisions change for bit nodes of one or more layers of a layered LDPC decoder and to update accumulated partial syndrome calculations for those layers. As hard decisions of bit nodes are generated, they are compared with their previous values. If the hard decisions change, partial syndrome calculations are accumulated and updated for the layers having non-zero elements in one or more columns of the parity check matrix corresponding to the bit nodes of the changed hard decisions. If the hard decisions for the bit nodes are unchanged, the partial syndrome calculations for the corresponding layers are not updated. Changes to hard decisions of codewords are tracked and partial syndromes are flipped for the layers of the columns of the parity check matrix corresponding to the bit nodes of the changed hard decisions.