The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Oct. 15, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Atsushi Yamada, Nagoya, JP;

Hideyuki Akanuma, Minowa-machi, JP;

Katsumi Inoue, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 3/158 (2006.01); H02M 1/32 (2007.01); H02M 1/088 (2006.01); H02P 7/03 (2016.01); H02P 29/024 (2016.01);
U.S. Cl.
CPC ...
H02M 3/158 (2013.01); H02M 1/088 (2013.01); H02M 1/32 (2013.01); H02P 7/04 (2016.02); H02P 29/024 (2013.01);
Abstract

An output transistor of an output circuit that outputs a large current may have a partial fault, but such a partial fault may not be detected because the transistor is very large. To address this, the invention provides an output circuit in which one output transistor is divided into a plurality of transistors, and a plurality of pads that are connected correspondingly to the transistors are provided. Fault detection can be performed on the plurality of transistors by using each pad. At least some of the pads are connected to one same output terminal of the substrate or the like.


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