The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Aug. 28, 2015
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Suk Ki Kim, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/24 (2006.01); H01L 45/00 (2006.01); H01L 29/66 (2006.01); H01L 27/22 (2006.01); H01L 27/10 (2006.01); H01L 21/762 (2006.01); H01L 29/786 (2006.01); H01L 29/49 (2006.01); H01L 29/165 (2006.01); H01L 29/267 (2006.01);
U.S. Cl.
CPC ...
H01L 27/2436 (2013.01); H01L 21/7624 (2013.01); H01L 27/101 (2013.01); H01L 27/228 (2013.01); H01L 27/2463 (2013.01); H01L 29/6681 (2013.01); H01L 29/7869 (2013.01); H01L 29/78618 (2013.01); H01L 29/78681 (2013.01); H01L 45/04 (2013.01); H01L 45/06 (2013.01); H01L 45/126 (2013.01); H01L 45/1233 (2013.01); H01L 45/14 (2013.01); H01L 45/141 (2013.01); H01L 45/147 (2013.01); H01L 45/16 (2013.01); H01L 29/165 (2013.01); H01L 29/267 (2013.01); H01L 29/495 (2013.01); H01L 29/4966 (2013.01);
Abstract

A 3D semiconductor device and a method of manufacturing the same are provided. The 3D semiconductor device includes a semiconductor substrate, an active line formed on the insulating layer, including a source region, a drain region and a channel region positioned between the source region and the drain region, a gate electrode located on a portion of the active line, corresponding to a region between the source region and the drain region, and extending to a direction substantially perpendicular to the active line, and a line-shaped common source node formed to be electrically coupled to the source region and extending substantially in parallel to the gate electrode in a space between gate electrodes. The source region and the drain region of the active line are formed of a first material and the channel region of the active line is formed of a second material being different from the first material.


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