The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Nov. 09, 2012
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Boe Optoelectronics Technology Co., Ltd., Anhui, CN;

Inventors:

Xiaoyu Yang, Beijing, CN;

Xiaosong Zhang, Beijing, CN;

Jiujuan Yang, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 27/12 (2006.01); G02F 1/1362 (2006.01);
U.S. Cl.
CPC ...
H01L 22/14 (2013.01); G02F 1/1362 (2013.01); H01L 27/1262 (2013.01); G02F 2001/136254 (2013.01);
Abstract

An embodiment of the present invention provides a manufacturing method of an array substrate comprising forming a gate detecting pattern on the array substrate with gate lines and common electrode lines formed thereon, the gate detecting pattern being arranged on one side of a pixel region of the array substrate and used to connect all the common electrode lines for pixel units; and performing a short circuit or a open circuit detection, wherein if the difference between a signal received by a receiving terminal for a gate line and a signal transmitted from a transmitting terminal for the gate line is larger than a predetermined detection threshold value, it is determined that short circuit between the gate line and a common electrode line or open circuit in the gate line occurs.


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