The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Nov. 25, 2014
Huawei Technologies Co., Ltd., Shenzhen, CN;
Xin Du, Hangzhou, CN;
Shuiping Li, Shenzhen, CN;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
Embodiments of the present invention disclose a radial distortion parameter acquiring method and apparatus. The method includes: randomly selecting a plane as a first plane; making an optical axis of a digital image capture device perpendicular to the first plane, and photographing the first plane to obtain a distorted image of the first plane; acquiring n arcs from the distorted image; and obtaining, by calculation, a radial distortion parameter of the digital image capture device according to the arcs. The apparatus includes: a selecting unit, a photographing unit, an acquiring unit, and a calculating unit. By applying the embodiments of the present invention, only one distorted image needs to be photographed to acquire a radial distortion parameter of a digital image capture device, and the distorted image can be acquired depending on a natural environment.