The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Nov. 03, 2006
Applicants:

S. Dale Ander, Dallas, TX (US);

Michael G. Christiansen, Plano, TX (US);

Ashish Rajput, Euless, TX (US);

Palanisamy Gounder, Irving, TX (US);

Guy Briggs, Coppell, TX (US);

Thurman Pylant, Priddy, TX (US);

Lalit Pant, Irving, TX (US);

Jason Randall, Frisco, TX (US);

Inventors:

S. Dale Ander, Dallas, TX (US);

Michael G. Christiansen, Plano, TX (US);

Ashish Rajput, Euless, TX (US);

Palanisamy Gounder, Irving, TX (US);

Guy Briggs, Coppell, TX (US);

Thurman Pylant, Priddy, TX (US);

Lalit Pant, Irving, TX (US);

Jason Randall, Frisco, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G06Q 10/0633 (2013.01);
Abstract

A method and apparatus for examining workflow processes can include monitoring system having a definition element that selectively defines one or more workflow process elements of a corresponding workflow, and a monitor element that identifies one or more monitoring parameters for each of the workflow process elements. The system can also include one or more operational aspects of the one or more workflow process elements according to corresponding definitions and monitoring parameters.


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