The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Aug. 31, 2015
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Atsushi Irie, Nara, JP;

Mutsuki Takagiwa, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); G06K 9/00288 (2013.01); G06K 9/52 (2013.01); G06K 9/626 (2013.01); G06K 9/6292 (2013.01); G06K 2009/00322 (2013.01);
Abstract

An identification apparatus performs classification using a plurality of classifiers, and calculates the reliability of its classification result. A data obtaining unit obtains input data. A feature quantity obtaining unit obtains a feature quantity corresponding to the input data. A plurality of classifiers receive input of the feature quantity and perform classification based on the input feature quantity. An identification unit inputs the feature quantity into each of the classifiers, and generates a single second classification result based on a plurality of classification results obtained from the classifiers. A reliability generation unit generates a reliability of the second classification result based on variations across the plurality of classification results.


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