The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Sep. 12, 2014
Nec Hong Kong Limited, Hong Kong, CN;
Hiroshi Yamada, Tokyo, JP;
Nobuhisa Shiraishi, Tokyo, JP;
Eric Lau, Hong Kong, CN;
Elsa Wong, Hong Kong, CN;
NEC HONG KONG LIMITED, Hong Kong, CN;
Abstract
A time difference measurement system includes: a first face detection unit for detecting face areas from images photographed by first camera and that slices them as face images; a first face feature extraction unit for extracting first face feature amounts from the face images, and a memory that stores the first face feature amounts in association with shooting time instants. The system includes, for a second camera, an analogous second face detection unit, a second overlap deletion unit and a second face feature extraction unit. The system includes: a face collation unit for collating the second face feature amounts with the first face values; and a time difference calculation unit for calculating time difference between the first and second shooting time instants. The system further includes at least one of first and second overlap deletion units for comparing a plurality of face images sliced from different frames.