The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Sep. 19, 2016
Syntouch, Llc, Los Angeles, CA (US);
Jeremy A. Fishel, Fullerton, CA (US);
Gerald E. Loeb, South Pasadena, CA (US);
SYNTOUCH, LLC, Los Angeles, CA (US);
Abstract
An object investigation and classification system may include an object test system, a data storage system, and a data processing system. The object test system may receive a command to perform at least one action with a test object, perform the at least one action with the test object, and return test information indicative of at least one percept resulting from the at least one action. The data storage system may contain an experience database containing data indicative of multiple classifications and, for each classification, at least one action that was performed with at least one previously-observed reference object having this classification, and at least one percept value that is based in whole or in part on the test information resulting from the at least one action.