The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Aug. 20, 2012
Applicants:

Annie Cuyt, Wilrijk, BE;

Wen-shin Lee, Berchem, BE;

Inventors:

Annie Cuyt, Wilrijk, BE;

Wen-Shin Lee, Berchem, BE;

Assignees:

UNIVERSITY OF ANTWERP, Antwerp, BE;

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); H03M 7/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/10 (2013.01); H03M 7/3062 (2013.01);
Abstract

A computer-based method for characterizing data dependent on at least one variable is described. The method comprises sampling the data in a smart manner by sampling the data in a finite sequence of sampling points, the finite sequence of sampling points being controlled by a magnifying factor for controlling a spacing between elements of the finite sequence of sampling points and being determined such that function values of functions of a family of functions in said finite sequence of sampling points satisfy a recurrence relation. A corresponding device also is described as well as software-related products.


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