The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Apr. 16, 2014
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventors:

Hyung-Gyun Yang, Icheon-si, KR;

Hyung-Dong Lee, Yongin-si, KR;

Yong-Kee Kwon, Seoul, KR;

Young-Suk Moon, Icheon-si, KR;

Hong-Sik Kim, Seongnam-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/16 (2006.01); G06F 13/30 (2006.01);
U.S. Cl.
CPC ...
G06F 13/1673 (2013.01); G06F 13/1668 (2013.01); G06F 13/30 (2013.01);
Abstract

A semiconductor device may include: a storage unit configured to store program codes provided through control of a processor core; and a control unit configured to perform a control operation on a semiconductor memory device according to the program codes.


Find Patent Forward Citations

Yang, Hyung-Gyun. (2017). Semiconductor device for performing test and repair operations (U.S. Patent No. 9690723). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9690723

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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