The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Dec. 10, 2015
Jonas Foelling, Heidelberg, DE;
Jonas Foelling, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A widefield microscope illumination system and method with a microscope objective and an illumination light source that sends widefield illumination light along illumination beam paths. Illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined annular or annular-segment-shaped illumination light entry area having a large offset to an optical objective axis of the objective. A spatially resolving light detector detects light sent from an illuminated sample through the microscope objective along a detected light beam path. An automatic illumination light beam path manipulation device is controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by means of which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of different illumination light entry sites.